One further step in simplifying materials characterization is the analysis of basic logic circuits. Here, up to 36 single transistors are interconnected to inverters and ring oscillators. Monitoring of the active materials then only requires a frequency measurement of the ring oscillators which can be automated easily. This prevents the complicated and time-consuming measurement and analysis of the individual transistor characteristic. Furthermore, it is not only reliable information about logic capability that is acquired. The dynamic characteristics of the inverters are also determined.